Atomic-scale scanning single-electron transistor microscopy for low-angle twisted two-dimensional heterostructures
Behnam Esmaeilzadeh; Hossein Chamkouri; Zubaida Rukhsana Usha; Syed Asad Maqbool; Muhammad Touqeer
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Current Opinion in Solid State and Materials Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.cossms.2026.101263
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Cite this source
Behnam Esmaeilzadeh; Hossein Chamkouri; Zubaida Rukhsana Usha; Syed Asad Maqbool; Muhammad Touqeer. Atomic-scale scanning single-electron transistor microscopy for low-angle twisted two-dimensional heterostructures. Current Opinion in Solid State and Materials Science. 2026-06. https://doi.org/10.1016/j.cossms.2026.101263