Assessment and Correction of High-Multiplicity Charge Sharing Events in Sub-100um Semiconductor Pixelated Detectors
A. Whittemore; K. Patel; E.M. Zannoni
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/nss/mic/rtsd57106.2025.11286318
The original publisher provides the full text and its access options.
Cite this source
A. Whittemore; K. Patel; E.M. Zannoni. Assessment and Correction of High-Multiplicity Charge Sharing Events in Sub-100um Semiconductor Pixelated Detectors. 2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD). 2025-11-01. https://doi.org/10.1109/nss/mic/rtsd57106.2025.11286318