A Multiport Transistor Characterisation Technique Including Mutual Inductances Using 2-Port VNA
Kacper Kołodziej; Stéphane Baffreau; Paul-Etienne Vidal; Bruno Allard
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 23rd International Symposium on Power Electronics (Ee)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ee67693.2025.11227091
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Cite this source
Kacper Kołodziej; Stéphane Baffreau; Paul-Etienne Vidal; Bruno Allard. A Multiport Transistor Characterisation Technique Including Mutual Inductances Using 2-Port VNA. 2025 23rd International Symposium on Power Electronics (Ee). 2025-10-08. https://doi.org/10.1109/ee67693.2025.11227091