Impact of Device Design Parameters on Fabricated Recessed-Gate Enhancement Mode Gallium Nitride High Electron-Mobility Transistor
Muhamad Amri Ismail; Nurul Ainie Ismail; Sharaifah Kamariah Wan Sabli
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 23rd Student Conference on Research and Development (SCOReD)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/scored68498.2025.11398886
The original publisher provides the full text and its access options.
Cite this source
Muhamad Amri Ismail; Nurul Ainie Ismail; Sharaifah Kamariah Wan Sabli. Impact of Device Design Parameters on Fabricated Recessed-Gate Enhancement Mode Gallium Nitride High Electron-Mobility Transistor. 2025 IEEE 23rd Student Conference on Research and Development (SCOReD). 2025-11-25. https://doi.org/10.1109/scored68498.2025.11398886