Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element

Krzysztof Dziarski; Arkadiusz Hulewicz; Przemyslaw Otomański

Published
Publisher
IEEE
Journal / collection
2025 15th International Conference on Measurement
Research area
Semiconductors
Source type
Conference paper
DOI
10.23919/measurement66999.2025.11078693

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Krzysztof Dziarski; Arkadiusz Hulewicz; Przemyslaw Otomański. The Uncertainty of the Indirect Thermographic Measurement of the Temperature of the Semiconductor Element. 2025 15th International Conference on Measurement. 2025-06-02. https://doi.org/10.23919/measurement66999.2025.11078693

Download RIS