A multi-objective feature selection and self-paced ensemble framework for semiconductor defect detection
H. Zheng; X. Gao; X. Yang; G. Jing; M. Yang; Y. Liu
- Published
- Publisher
- Production Engineering Institute (PEI), Faculty of Mechanical Engineering
- Journal / collection
- Advances in Production Engineering & Management
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.14743/apem2025.4.552
The original publisher provides the full text and its access options.
Cite this source
H. Zheng; X. Gao; X. Yang; G. Jing; M. Yang; Y. Liu. A multi-objective feature selection and self-paced ensemble framework for semiconductor defect detection. Advances in Production Engineering & Management. 2025-12-31. https://doi.org/10.14743/apem2025.4.552