Validation of dynamic line rating model using IEEE738 with digital twin for a power grid
Aldrich Zeno; Basanta R. Pokhrel; Santiago S. Acevedo; Irina Oleinikova
- Published
- Publisher
- Institution of Engineering and Technology (IET)
- Journal / collection
- IET Conference Proceedings
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.1049/icp.2025.2417
The original publisher provides the full text and its access options.
Cite this source
Aldrich Zeno; Basanta R. Pokhrel; Santiago S. Acevedo; Irina Oleinikova. Validation of dynamic line rating model using IEEE738 with digital twin for a power grid. IET Conference Proceedings. 2025-12. https://doi.org/10.1049/icp.2025.2417