Self-Attention Driven Transformer for Reliable Semiconductor Map Defect Diagnosis System
E. Prashanthi; Polaka Durga Sai Lakshmi; Nagareddy Sushma; Yellu Nikhitha
- Published
- Publisher
- Thomson & Ryberg Publications
- Journal / collection
- International Journal of Engineering Research and Science & Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.62643/ijerst.2026.v22.n2.pp31-39
The original publisher provides the full text and its access options.
Cite this source
E. Prashanthi; Polaka Durga Sai Lakshmi; Nagareddy Sushma; Yellu Nikhitha. Self-Attention Driven Transformer for Reliable Semiconductor Map Defect Diagnosis System. International Journal of Engineering Research and Science & Technology. 2026-04-01. https://doi.org/10.62643/ijerst.2026.v22.n2.pp31-39