Quantification of Transient Voltage Rise in UHVDC Sending End Power Grid Under Commutation Failure
Haoran Ge; Tao Xu; Jianan Mu; Lin Cheng; Ning Chen; Luming Ge; Xiong Du
- Published
- Publisher
- MDPI AG
- Journal / collection
- Electronics
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.3390/electronics14244855
The original publisher provides the full text and its access options.
Cite this source
Haoran Ge; Tao Xu; Jianan Mu; Lin Cheng; Ning Chen; Luming Ge; Xiong Du. Quantification of Transient Voltage Rise in UHVDC Sending End Power Grid Under Commutation Failure. Electronics. 2025-12-10. https://doi.org/10.3390/electronics14244855