Insight Analysis of Channel Length Variation in Ion-Sensitive Field Effect Transistor (ISFET)
Vimala P; Suveetha Dhanaselvam; Sharon Geege A; T S Arun Samuel; Jeyanthi J.E
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 17th International Conference on Computational Intelligence and Communication Networks (CICN)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/cicn67655.2025.11368315
The original publisher provides the full text and its access options.
Cite this source
Vimala P; Suveetha Dhanaselvam; Sharon Geege A; T S Arun Samuel; Jeyanthi J.E. Insight Analysis of Channel Length Variation in Ion-Sensitive Field Effect Transistor (ISFET). 2025 IEEE 17th International Conference on Computational Intelligence and Communication Networks (CICN). 2025-12-20. https://doi.org/10.1109/cicn67655.2025.11368315