GAN-Based Super-Resolution in Linear R-SAM Imaging for Enhanced Non-Destructive Semiconductor Measurement
Thi Thu Ha Vu; Tan Hung Vo; Trong Nhan Nguyen; Jaeyeop Choi; Le Hai Tran; Vu Hoang Minh Doan; Van Bang Nguyen; Wonjo Lee; Sudip Mondal; Junghwan Oh
- Published
- Publisher
- MDPI AG
- Journal / collection
- Applied Sciences
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/app15126780
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Cite this source
Thi Thu Ha Vu; Tan Hung Vo; Trong Nhan Nguyen; Jaeyeop Choi; Le Hai Tran; Vu Hoang Minh Doan; Van Bang Nguyen; Wonjo Lee; Sudip Mondal; Junghwan Oh. GAN-Based Super-Resolution in Linear R-SAM Imaging for Enhanced Non-Destructive Semiconductor Measurement. Applied Sciences. 2025-06-17. https://doi.org/10.3390/app15126780