Hybrid and Gradient-Boosted Regression Models for Accurate Transistor Drain Current Prediction
P. Sirish Kumar; A. Jayalaxmi; Ch. Rajasekhar; K. Kavitha; Ramya Krishna Isukapalli; M. Pravallika
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iatmsi68868.2026.11465635
The original publisher provides the full text and its access options.
Cite this source
P. Sirish Kumar; A. Jayalaxmi; Ch. Rajasekhar; K. Kavitha; Ramya Krishna Isukapalli; M. Pravallika. Hybrid and Gradient-Boosted Regression Models for Accurate Transistor Drain Current Prediction. 2026 IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI). 2026-03-12. https://doi.org/10.1109/iatmsi68868.2026.11465635