Insulation diagnosis of power semiconductor using a PCB based microstrip patch-type partial discharge sensor
Gyeong-Yeol Lee; Sung-Wook Kim
- Published
- Publisher
- Walter de Gruyter GmbH
- Journal / collection
- Journal of Electrical Engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.2478/jee-2026-0014
The original publisher provides the full text and its access options.
Cite this source
Gyeong-Yeol Lee; Sung-Wook Kim. Insulation diagnosis of power semiconductor using a PCB based microstrip patch-type partial discharge sensor. Journal of Electrical Engineering. 2026-04-01. https://doi.org/10.2478/jee-2026-0014