Study on power grid reliability calculation under thermo-electric coupled network
Wenjie Pan; Chenfang Gu; Jun Han; Chao Cai; Haofei Chen; Anjie Fan
- Published
- Publisher
- Institution of Engineering and Technology (IET)
- Journal / collection
- IET Conference Proceedings
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.1049/icp.2026.1620
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Cite this source
Wenjie Pan; Chenfang Gu; Jun Han; Chao Cai; Haofei Chen; Anjie Fan. Study on power grid reliability calculation under thermo-electric coupled network. IET Conference Proceedings. 2026-07-01. https://doi.org/10.1049/icp.2026.1620