A novel calibration technique for silicon semiconductor Rn detectors by using radioactive decay method
Chun-Chih Lin; Shih-Jung Lin; Huan-Ching Huang; Zi-Yi Yang; Neng-Chuan Tien; Chin-Wei Wu; Chun-Liang Yeh; Ching-Yi Chen; Chien-Yi Ting
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Radiation Physics and Chemistry
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.radphyschem.2025.112772
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Cite this source
Chun-Chih Lin; Shih-Jung Lin; Huan-Ching Huang; Zi-Yi Yang; Neng-Chuan Tien; Chin-Wei Wu; Chun-Liang Yeh; Ching-Yi Chen; Chien-Yi Ting. A novel calibration technique for silicon semiconductor Rn detectors by using radioactive decay method. Radiation Physics and Chemistry. 2025-09. https://doi.org/10.1016/j.radphyschem.2025.112772