Characterization of the rejection ratio in a semiconductor laser-based Thomson scattering spectrometer
Ang Li; Ding Wu; Yong Wang; Cong Li; Ran Hai; Chunlei Feng; Hongbin Ding
- Published
- Publisher
- SPIE
- Journal / collection
- AOPC 2025: Optical Spectroscopy and Imaging; and Atmospheric and Environmental Optics
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1117/12.3081736
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Cite this source
Ang Li; Ding Wu; Yong Wang; Cong Li; Ran Hai; Chunlei Feng; Hongbin Ding. Characterization of the rejection ratio in a semiconductor laser-based Thomson scattering spectrometer. AOPC 2025: Optical Spectroscopy and Imaging; and Atmospheric and Environmental Optics. 2025-10-28. https://doi.org/10.1117/12.3081736