Automatic classification of transistor die temperature based on thermograms using the YOLO algorithm
Krzysztof Dziarski; Arkadiusz Hulewicz
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE International Symposium on Artificial Intelligence for Instrumentation and Measurement (AI4IM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ai4im69129.2026.11558214
The original publisher provides the full text and its access options.
Cite this source
Krzysztof Dziarski; Arkadiusz Hulewicz. Automatic classification of transistor die temperature based on thermograms using the YOLO algorithm. 2026 IEEE International Symposium on Artificial Intelligence for Instrumentation and Measurement (AI4IM). 2026-05-21. https://doi.org/10.1109/ai4im69129.2026.11558214