Negative capacitance tunneling field-effect transistor for logic electronics and photodetection devices
Haoran Yan; Shuaiqin Wu; Yan Chen; Yongguang Xiao; Ke Xiong; Qianru Zhao; Minghua Tang; Hanxue Jiao; Tie Lin; Hong Shen; Xiangjian Meng; Xudong Wang; Junhao Chu; Jianlu Wang
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Applied Materials Today
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.apmt.2025.102737
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Cite this source
Haoran Yan; Shuaiqin Wu; Yan Chen; Yongguang Xiao; Ke Xiong; Qianru Zhao; Minghua Tang; Hanxue Jiao; Tie Lin; Hong Shen; Xiangjian Meng; Xudong Wang; Junhao Chu; Jianlu Wang. Negative capacitance tunneling field-effect transistor for logic electronics and photodetection devices. Applied Materials Today. 2025-06. https://doi.org/10.1016/j.apmt.2025.102737