Characterization and Modeling of Nonlinear Transistor Output Impedance for Very High Frequency Converters
Sixue Li; Matthieu Beley; Loris Pace; Arthur Perodou; Fan Zhang
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.23919/ipec-nagasaki2026-ec64663.2026.11597478
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Cite this source
Sixue Li; Matthieu Beley; Loris Pace; Arthur Perodou; Fan Zhang. Characterization and Modeling of Nonlinear Transistor Output Impedance for Very High Frequency Converters. 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia). 2026-05-31. https://doi.org/10.23919/ipec-nagasaki2026-ec64663.2026.11597478