Testing of Novel Semiconductor Opening Switches Using Magnetic Switching
B. Esser; J. C. Stephens; J. C. Dickens; A. A. Neuber; J. J. Mankowski; C. A. Chapin; Q. Shao; D. O. Smith; L. F. Voss; J. A. Schrock; B. Hoff; S. Heidger
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Plasma Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tps.2025.3586185
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Cite this source
B. Esser; J. C. Stephens; J. C. Dickens; A. A. Neuber; J. J. Mankowski; C. A. Chapin; Q. Shao; D. O. Smith; L. F. Voss; J. A. Schrock; B. Hoff; S. Heidger. Testing of Novel Semiconductor Opening Switches Using Magnetic Switching. IEEE Transactions on Plasma Science. 2025-08. https://doi.org/10.1109/tps.2025.3586185