A survey on semiconductor wafer yield prediction by artificial intelligence
Dongyan Zhao; Yining Chen; Pang Guo; Fangke Chen; Ruyue Jing; Xin Xu; Yanning Chen; Fang Liu; Bo Wu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Journal
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1016/j.mejo.2025.106958
The original publisher provides the full text and its access options.
Cite this source
Dongyan Zhao; Yining Chen; Pang Guo; Fangke Chen; Ruyue Jing; Xin Xu; Yanning Chen; Fang Liu; Bo Wu. A survey on semiconductor wafer yield prediction by artificial intelligence. Microelectronics Journal. 2026-01. https://doi.org/10.1016/j.mejo.2025.106958