Band Offset Analysis at the Te/ALD-Grown Al 2 O 3 Heterojunction for Transistor Applications
Janggeun Shin; Tae In Kim; Ick-Joon Park
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Applied Electronic Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acsaelm.6c00067
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Cite this source
Janggeun Shin; Tae In Kim; Ick-Joon Park. Band Offset Analysis at the Te/ALD-Grown Al 2 O 3 Heterojunction for Transistor Applications. ACS Applied Electronic Materials. 2026-03-13. https://doi.org/10.1021/acsaelm.6c00067