Optimization for Intelligent Manufacturing Quality Inspectio
Jiayao Su; Yaxin Zhang; Yuyue Zhou; Aiting Wang
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 5th International Conference on Mechanical, Electronics and Electrical and Automation Control (METMS)
- Research area
- Industrial systems
- Source type
- Conference paper
- DOI
- 10.1109/metms65303.2025.11047662
The original publisher provides the full text and its access options.
Cite this source
Jiayao Su; Yaxin Zhang; Yuyue Zhou; Aiting Wang. Optimization for Intelligent Manufacturing Quality Inspectio. 2025 5th International Conference on Mechanical, Electronics and Electrical and Automation Control (METMS). 2025-05-09. https://doi.org/10.1109/metms65303.2025.11047662