Few-Shot Identification of Semiconductor Wafer Defects with Metric Learning and Domain Generalization
Rui Zhou; Qiang Zhang
- Published
- Publisher
- International Study Counselor
- Journal / collection
- American Journal of Data Science and Analysis
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.71465/ajdsa3464
The original publisher provides the full text and its access options.
Cite this source
Rui Zhou; Qiang Zhang. Few-Shot Identification of Semiconductor Wafer Defects with Metric Learning and Domain Generalization. American Journal of Data Science and Analysis. 2025-12-31. https://doi.org/10.71465/ajdsa3464