Semiconductor Bandgap Measurements: Overview of Optical, Electrical, and Device‐Level Techniques
Sanjay Sahare; Mykhailo M. Solovan; Andrii I. Mostovyi; Hryhorii P. Parkhomenko; Nora Schopp; Marcin Ziółek; Viktor V. Brus
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Optical Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/adom.202501747
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Cite this source
Sanjay Sahare; Mykhailo M. Solovan; Andrii I. Mostovyi; Hryhorii P. Parkhomenko; Nora Schopp; Marcin Ziółek; Viktor V. Brus. Semiconductor Bandgap Measurements: Overview of Optical, Electrical, and Device‐Level Techniques. Advanced Optical Materials. 2025-08-28. https://doi.org/10.1002/adom.202501747