Reliability assessment for multistate semiconductor global logistics networks with freight charges and carbon taxes considerations
Ping-Chen Chang; Cheng-Ta Yeh; Tzu-Yun Cheng; Vincent F. Yu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Reliability Engineering & System Safety
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.ress.2025.112027
The original publisher provides the full text and its access options.
Cite this source
Ping-Chen Chang; Cheng-Ta Yeh; Tzu-Yun Cheng; Vincent F. Yu. Reliability assessment for multistate semiconductor global logistics networks with freight charges and carbon taxes considerations. Reliability Engineering & System Safety. 2026-05. https://doi.org/10.1016/j.ress.2025.112027