Understanding Degradation of Catalyst–Semiconductor Interfaces via In-Situ Nanoscale Characterization
Johanna Eichhorn
- Published
- Publisher
- FUNDACIO DE LA COMUNITAT VALENCIANA SCITO
- Journal / collection
- Proceedings of the MATSUS Spring 2026 Conference
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.29363/nanoge.matsusspring.2026.164
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Cite this source
Johanna Eichhorn. Understanding Degradation of Catalyst–Semiconductor Interfaces via In-Situ Nanoscale Characterization. Proceedings of the MATSUS Spring 2026 Conference. 2025-12-15. https://doi.org/10.29363/nanoge.matsusspring.2026.164