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Patent Citation Networks Anticipate Technology Lock-In Risk: Multimodal Evidence from China’s Semiconductor Industry

jilong zhang; Lei Chen

Published
Publisher
Springer Science and Business Media LLC
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.21203/rs.3.rs-10209838/v1

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jilong zhang; Lei Chen. Patent Citation Networks Anticipate Technology Lock-In Risk: Multimodal Evidence from China’s Semiconductor Industry. Springer Science and Business Media LLC. 2026-09-14. https://doi.org/10.21203/rs.3.rs-10209838/v1

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