Three-Transistor Antifuse OTP Memory: Design, Simulation and Behavioral Verification
Jyoti Thakur; Prof. Bhavesh Soni
- Published
- Publisher
- Lattice Science Publication (LSP)
- Journal / collection
- Indian Journal of VLSI Design
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.54105/ijvlsid.b1235.06010326
The original publisher provides the full text and its access options.
Cite this source
Jyoti Thakur; Prof. Bhavesh Soni. Three-Transistor Antifuse OTP Memory: Design, Simulation and Behavioral Verification. Indian Journal of VLSI Design. 2026-03-30. https://doi.org/10.54105/ijvlsid.b1235.06010326