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Research literature / Conference paper

Forecasting Wafer Fab Outputs using Lot Remaining Cycle Time Prediction in Semiconductor Manufacturing

Adrien Wartelle; Stéphane Dauzère-Pérès; Claude Yugma; Quentin Christ; Renaud Roussel

Published
Publisher
IEEE
Journal / collection
2025 IEEE 21st International Conference on Automation Science and Engineering (CASE)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/case58245.2025.11164128

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Adrien Wartelle; Stéphane Dauzère-Pérès; Claude Yugma; Quentin Christ; Renaud Roussel. Forecasting Wafer Fab Outputs using Lot Remaining Cycle Time Prediction in Semiconductor Manufacturing. 2025 IEEE 21st International Conference on Automation Science and Engineering (CASE). 2025-08-17. https://doi.org/10.1109/case58245.2025.11164128

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