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Research literature / Conference paper

Semiconductor-Focused Simulation Environment for Emitted Noise Sensitivity of MOSFET Parameters

Robert Kragl; Steffen Beushausen; Karl Oberdieck; Konstantin Spanos; Ingmar Kallfass

Published
Publisher
IEEE
Journal / collection
2025 International Symposium on Electromagnetic Compatibility – EMC Europe
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/emceurope61644.2025.11176251

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Robert Kragl; Steffen Beushausen; Karl Oberdieck; Konstantin Spanos; Ingmar Kallfass. Semiconductor-Focused Simulation Environment for Emitted Noise Sensitivity of MOSFET Parameters. 2025 International Symposium on Electromagnetic Compatibility – EMC Europe. 2025-09-01. https://doi.org/10.1109/emceurope61644.2025.11176251

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