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Fusing Handcrafted Spatial Descriptors with a Lightweight CNN for Semiconductor Wafer Map Defect Classification

Rahul Prabhu; Rishikesh Madhuvairy

Published
Publisher
MDPI AG
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.20944/preprints202603.1447.v1

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Rahul Prabhu; Rishikesh Madhuvairy. Fusing Handcrafted Spatial Descriptors with a Lightweight CNN for Semiconductor Wafer Map Defect Classification. MDPI AG. 2026-03-18. https://doi.org/10.20944/preprints202603.1447.v1

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