Influence of electrical properties on thermal boundary conductance at metal/semiconductor interface
Q. Pompidou; C. Acosta; M. Brouillard; N. Bercu; L. Giraudet; R. Sheikh; C. Adessi; S. Mérabia; S. Gomès; P.-O. Chapuis; J.-F. Robillard; M. Chirtoc; N. Horny
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Journal of Applied Physics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0303997
The original publisher provides the full text and its access options.
Cite this source
Q. Pompidou; C. Acosta; M. Brouillard; N. Bercu; L. Giraudet; R. Sheikh; C. Adessi; S. Mérabia; S. Gomès; P.-O. Chapuis; J.-F. Robillard; M. Chirtoc; N. Horny. Influence of electrical properties on thermal boundary conductance at metal/semiconductor interface. Journal of Applied Physics. 2026-01-08. https://doi.org/10.1063/5.0303997