Machine learning for metrology in manufacturing
Gisela Lanza; Robert Schmitt; Wim Dewulf; Hans Hansen; Yang Zhang; Benjamin Montavon; Florian Stamer
- Published
- Publisher
- Elsevier BV
- Journal / collection
- CIRP Annals
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1016/j.cirp.2026.04.109
The original publisher provides the full text and its access options.
Cite this source
Gisela Lanza; Robert Schmitt; Wim Dewulf; Hans Hansen; Yang Zhang; Benjamin Montavon; Florian Stamer. Machine learning for metrology in manufacturing. CIRP Annals. 2026. https://doi.org/10.1016/j.cirp.2026.04.109