A Review on Junction Temperature and ON-state Voltage Condition Monitoring of Power Semiconductor Devices
Xinming Yu; Jie Kong; Ning Wang; Kaichen Zhang; Frede Blaabjerg; Dao Zhou
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- Chinese Journal of Electrical Engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.23919/cjee.2025.000144
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Cite this source
Xinming Yu; Jie Kong; Ning Wang; Kaichen Zhang; Frede Blaabjerg; Dao Zhou. A Review on Junction Temperature and ON-state Voltage Condition Monitoring of Power Semiconductor Devices. Chinese Journal of Electrical Engineering. 2025-06. https://doi.org/10.23919/cjee.2025.000144