A Hybrid Simulation Modelling Framework for Stress Testing Rare Earth Element-Centric Semiconductor Supply Chains
Naoum Tsolakis; Wei Nie; Zhong Guan; Yongxu Zhao; Fangrui Li; Mariel Alem Fonseca; Deepesh Jayasekara; Garry Clawson; Gavin Harper; Mukesh Kumar
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Engineering Management
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tem.2026.3731827
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Cite this source
Naoum Tsolakis; Wei Nie; Zhong Guan; Yongxu Zhao; Fangrui Li; Mariel Alem Fonseca; Deepesh Jayasekara; Garry Clawson; Gavin Harper; Mukesh Kumar. A Hybrid Simulation Modelling Framework for Stress Testing Rare Earth Element-Centric Semiconductor Supply Chains. IEEE Transactions on Engineering Management. 2026. https://doi.org/10.1109/tem.2026.3731827