Method for determining the coordinate distribution of local inhomogeneities in the bulk of a semiconductor
Vahabov K.I.; Mirkomilova M.S.; Dzhuraev U.E.; Gaibov A.G.
- Published
- Publisher
- Premier Publishing s.r.o.
- Journal / collection
- European Journal of Technical and Natural Sciences
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.29013/ejtns-25-6-59-61
The original publisher provides the full text and its access options.
Cite this source
Vahabov K.I.; Mirkomilova M.S.; Dzhuraev U.E.; Gaibov A.G.. Method for determining the coordinate distribution of local inhomogeneities in the bulk of a semiconductor. European Journal of Technical and Natural Sciences. 2025-11-30. https://doi.org/10.29013/ejtns-25-6-59-61