Predicting temperature-dependent optoelectronic properties of semiconductor defects with equivariant neural networks
Xiangzhou Zhu; Patrick Rinke; David A. Egger
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- npj Computational Materials
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1038/s41524-026-02111-z
The original publisher provides the full text and its access options.
Cite this source
Xiangzhou Zhu; Patrick Rinke; David A. Egger. Predicting temperature-dependent optoelectronic properties of semiconductor defects with equivariant neural networks. npj Computational Materials. 2026-05-11. https://doi.org/10.1038/s41524-026-02111-z