Characterizing and Quantifying Filamentation in Broad-Area Semiconductor Lasers Using Information Measures
Oscar Ricardo Mejía Parra; Cristina Masoller
- Published
- Publisher
- EDP Sciences
- Journal / collection
- EPJ Web of Conferences
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1051/epjconf/202638904001
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Cite this source
Oscar Ricardo Mejía Parra; Cristina Masoller. Characterizing and Quantifying Filamentation in Broad-Area Semiconductor Lasers Using Information Measures. EPJ Web of Conferences. 2026. https://doi.org/10.1051/epjconf/202638904001