Cycle-to-failure Prediction of Power Semiconductor Modules based on Early Degradation Indicators
Yichi Zhang; Yi Zhang; Frede Blaabjerg; Huai Wang
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tpel.2026.3703216
The original publisher provides the full text and its access options.
Cite this source
Yichi Zhang; Yi Zhang; Frede Blaabjerg; Huai Wang. Cycle-to-failure Prediction of Power Semiconductor Modules based on Early Degradation Indicators. IEEE Transactions on Power Electronics. 2026. https://doi.org/10.1109/tpel.2026.3703216