Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Investigation of Linearity Performance in p-GaN Gate Enhancement-Mode High Electron Mobility Transistor

Nipun Sharma; Ashish Raman; Pankaj Kumar; Sahil Hamid; Mohit Kumar

Published
Publisher
IEEE
Journal / collection
2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/cipher70417.2026.11523990

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Nipun Sharma; Ashish Raman; Pankaj Kumar; Sahil Hamid; Mohit Kumar. Investigation of Linearity Performance in p-GaN Gate Enhancement-Mode High Electron Mobility Transistor. 2026 International Conference on Intelligent Processing, Hardware, Electronics, and Radio Systems (CIPHER). 2026-02-13. https://doi.org/10.1109/cipher70417.2026.11523990

Download RIS