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Research literature / Conference paper

Transistor-to-GDS Reliability Analysis in Sub-3nm: Impact of Self-Heating and Aging on Timing

Swati Deshwal; Hadi Nour Eddine; Mahdi Benkhelifa; Albi Mema; Yogesh S. Chauhan; Hussam Amrouch

Published
Publisher
IEEE
Journal / collection
2025 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/islped65674.2025.11261703

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Swati Deshwal; Hadi Nour Eddine; Mahdi Benkhelifa; Albi Mema; Yogesh S. Chauhan; Hussam Amrouch. Transistor-to-GDS Reliability Analysis in Sub-3nm: Impact of Self-Heating and Aging on Timing. 2025 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED). 2025-08-06. https://doi.org/10.1109/islped65674.2025.11261703

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