Linking inclusion characterisics to stainless steel corrosion in semiconductor HCl environments via machine leaning approaches
Ye Zhang; Zhice Yang; Chaoran Ma; Yong Hua; Limin Chang; Tao Zhang; Fuhui Wang
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Corrosion Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.corsci.2026.113666
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Cite this source
Ye Zhang; Zhice Yang; Chaoran Ma; Yong Hua; Limin Chang; Tao Zhang; Fuhui Wang. Linking inclusion characterisics to stainless steel corrosion in semiconductor HCl environments via machine leaning approaches. Corrosion Science. 2026-04. https://doi.org/10.1016/j.corsci.2026.113666