Measurement of the low temperature dependence in semiconductor materials by laser excited Raman spectroscopy
Zhijian Guo; Zhiliang Yang; Peng Liu; Yuchen Liu; Kang An; Liangxian Chen; Jinlong Liu; Junjun Wei; Chengming Li
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Journal of Luminescence
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.jlumin.2025.121593
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Cite this source
Zhijian Guo; Zhiliang Yang; Peng Liu; Yuchen Liu; Kang An; Liangxian Chen; Jinlong Liu; Junjun Wei; Chengming Li. Measurement of the low temperature dependence in semiconductor materials by laser excited Raman spectroscopy. Journal of Luminescence. 2025-12. https://doi.org/10.1016/j.jlumin.2025.121593