Reliability Testing of Semiconductor Components under Mechanical Shock and Vibration in Automotive Systems
Nikunj Chandrakant Gediya
- Published
- Publisher
- International Journal for Research in Applied Science and Engineering Technology
- Journal / collection
- International Journal for Research in Applied Science and Engineering Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.22214/ijraset.2025.73228
The original publisher provides the full text and its access options.
Cite this source
Nikunj Chandrakant Gediya. Reliability Testing of Semiconductor Components under Mechanical Shock and Vibration in Automotive Systems. International Journal for Research in Applied Science and Engineering Technology. 2025-07-31. https://doi.org/10.22214/ijraset.2025.73228