Innovative Performance of 6th Generation 11nm DRAM Cell Transistor for HBM4 Application
Shinwoo Jeong; Jiuk Jang; Chulmin Kim; Yuseok Choi; Youngwoo Son; Dongsoo Woo; Hoin Ryu; KyoSuk Chae; Byung-hyun Lee; Sangjoon Hwang
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE/JSAP Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/vlsitechnologyandcir65830.2026.11577343
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Cite this source
Shinwoo Jeong; Jiuk Jang; Chulmin Kim; Yuseok Choi; Youngwoo Son; Dongsoo Woo; Hoin Ryu; KyoSuk Chae; Byung-hyun Lee; Sangjoon Hwang. Innovative Performance of 6th Generation 11nm DRAM Cell Transistor for HBM4 Application. 2026 IEEE/JSAP Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits). 2026-06-14. https://doi.org/10.1109/vlsitechnologyandcir65830.2026.11577343