Direct Measurement of Terahertz Conductivity in a Gated Monolayer Semiconductor
Su-Di Chen; Qixin Feng; Wenyu Zhao; Ruishi Qi; Zuocheng Zhang; Dishan Abeysinghe; Can Uzundal; Jingxu Xie; Takashi Taniguchi; Kenji Watanabe; Feng Wang
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- Nano Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acs.nanolett.5c01605
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Cite this source
Su-Di Chen; Qixin Feng; Wenyu Zhao; Ruishi Qi; Zuocheng Zhang; Dishan Abeysinghe; Can Uzundal; Jingxu Xie; Takashi Taniguchi; Kenji Watanabe; Feng Wang. Direct Measurement of Terahertz Conductivity in a Gated Monolayer Semiconductor. Nano Letters. 2025-05-05. https://doi.org/10.1021/acs.nanolett.5c01605