SRAM Static Entropy Extraction From Every Single Transistor in Unmodified Bitcell and Data Fingerprinting for Provenance Assurance
Tianqi Wang; Joydeep Basu; Viveka Konandur Rajanna; Massimo Alioto
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of Solid-State Circuits
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jssc.2025.3608858
The original publisher provides the full text and its access options.
Cite this source
Tianqi Wang; Joydeep Basu; Viveka Konandur Rajanna; Massimo Alioto. SRAM Static Entropy Extraction From Every Single Transistor in Unmodified Bitcell and Data Fingerprinting for Provenance Assurance. IEEE Journal of Solid-State Circuits. 2026-02. https://doi.org/10.1109/jssc.2025.3608858