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Research literature / Conference paper

Intelligent Feature Selection for Semiconductor Manufacturing Using a Hybrid Genetic Algorithm and Neural Network

K. Padmapriya; K. Kavitha; R. Senthamil Selvan; Basi Reddy A.; Manisha Bhimrao Mane

Published
Publisher
IEEE
Journal / collection
2026 IEEE 2nd International Conference on Secure IoT, Assured and Trusted Computing (SATC)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/satc69565.2026.11542511

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K. Padmapriya; K. Kavitha; R. Senthamil Selvan; Basi Reddy A.; Manisha Bhimrao Mane. Intelligent Feature Selection for Semiconductor Manufacturing Using a Hybrid Genetic Algorithm and Neural Network. 2026 IEEE 2nd International Conference on Secure IoT, Assured and Trusted Computing (SATC). 2026-03-24. https://doi.org/10.1109/satc69565.2026.11542511

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