Thermally activated excess noise by subgap density-of-states in Si-doped ZnSnO thin-film transistor-type gas sensor
Sung-Tae Lee; Ji Ye Lee; Youngchan Cho; David Radermacher; Yoonki Hong; Sang Yeol Lee; Wonjun Shin
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Microsystems & Nanoengineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41378-026-01316-y
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Cite this source
Sung-Tae Lee; Ji Ye Lee; Youngchan Cho; David Radermacher; Yoonki Hong; Sang Yeol Lee; Wonjun Shin. Thermally activated excess noise by subgap density-of-states in Si-doped ZnSnO thin-film transistor-type gas sensor. Microsystems & Nanoengineering. 2026-05-18. https://doi.org/10.1038/s41378-026-01316-y